Facilites

Descriptions of all facilites with photos [pdf 1.8MB].

Microdevice Reliability Facility

This facility has been designed for measuring stress and failure evolution in thin films and thin film structures deposited on wafer substrates. Problems involving the processing and operation of thin-film structures in microelectronic and optoelectronic applications are of interest. Coherent gradient sensing (CGS) shearing interferometry is used for measuring curvature and inferring stresses in these structures. The facility is in a Class 1 cleanroom and is capable of measuring patterned wafers up to 300mm in diameter.

Dynamic Constitutive Testing Lab

Split Hopkinson bars are available for constitutive testing at comparatively high loading rates (strain rates up to 104). Distinct systems exist for compression, tension and torsion testing. High-speed digital oscilloscopes have been acquired to facilitate data acquisition.

Plate Impact Facility

The plate impact facility features a propellant gun for studies involving high speed impact and penetration. The system features a dedication VISAR for measurement of target velocity at the back surface and has been used in conjunction with other high-speed optical and infrared diagnostics.

Static Materials Testing Facility

Two MTS axial-torsional load frames are available for testing at comparatively low loading rates. The system has been upgraded to include a state-of-the-art TestStar controller.

Dynamic Materials Testing Facility

A variety of loading devices are available to facilitate study of material behavior over a wide range of impact conditions.

High-Speed Imaging Facility

High-speed imaging systems are available for the real-time visualization of dynamic deformation and failure. With a laser illumination source, optical interferometry is typically employed to provide quantitative information regarding the evolution of deformation and failure on a microsecond time scale.

High-Speed IR Visualization Lab

High-speed IR detector systems are used for the determination of transient temperature response of materials subjected to dynamic loading.

SPHIR: Small Particle Hypervelocity Impact Facility, a joint venture between Caltech and JPL

The SPHIR facility houses a two-stage light gas gun with over a dozen observation ports for extensive diagnostics implementation. The gas gun is capable of reaching velocities between 0.5 - 10 km/s, and can test any potential target material and geometry at any angle of impact. Launch packages can range from approximately 0.25 - 2.5 mm in diameter and 5 - 500 mg in weight, depending on density and shape. What makes SPHIR stand out from related gas gun facilities like NASA Ames or Johnson is that it has the capability of achieving higher velocities, producing multiple impacts per test run, and does so with drastically reduced turnaround times.

Dynamic Rupture on Frictional Interface Setup

Upper figure: Schematic illustration of the experimental configuration. Homalite samples are cut with an inclination angle and compressed with the far field load. Dynamic photoelasticity and laser velocimeters are used to capture the full field information of rupture propagation as well as local sliding velocity of the interface. Rupture nucleation is conducted by the means of exploding wire technique.
Lower figure: Photograph of the actual setup. Details of the laser velocimeters and Homalite samples are revealed.